Abstract
Abbreviated growth mode of InGaN-based light-emitting diodes on nano-patterned sapphire leads to reduction in dislocation density and non-radiative recombination rate, and 37% increase in internal quantum efficiency.
Original language | English (US) |
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Title of host publication | Conference on Lasers and Electro-Optics, CLEO 2010 |
State | Published - 2010 |
Externally published | Yes |
Event | Conference on Lasers and Electro-Optics, CLEO 2010 - San Jose, CA, United States Duration: May 16 2010 → May 21 2010 |
Other
Other | Conference on Lasers and Electro-Optics, CLEO 2010 |
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Country/Territory | United States |
City | San Jose, CA |
Period | 05/16/10 → 05/21/10 |
ASJC Scopus subject areas
- Instrumentation
- Atomic and Molecular Physics, and Optics