Abstract
The efficient coloration of LiF material, in the form of bulk and films, by EUV and soft X-rays emitted by a laser-plasma source is demonstrated. The short penetration depth of soft-X-rays is exploited to obtain high spatial resolution luminescent patterns while the high dynamic range of proportionality between X-ray dose and coloration is exploited for using LiF as image detector in micro-radiography and soft X-ray microscopy applications.
Original language | English (US) |
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Pages (from-to) | 300-304 |
Number of pages | 5 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5131 |
DOIs | |
State | Published - 2002 |
Externally published | Yes |
Event | Third GR-I International Conference on New Laser Technologies and Applications - Patras, Greece Duration: Sep 5 2002 → Sep 8 2002 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Applied Mathematics
- Electrical and Electronic Engineering
- Computer Science Applications