Highly Accurate Thickness Determination of 2D Materials

Yiping Xiao; Wenwen Zheng; Bin Yuan; Chao Wen; Mario Lanza

doi:10.1002/crat.202100056

Highly Accurate Thickness Determination of 2D Materials

Yiping Xiao, Wenwen Zheng, Bin Yuan, Chao Wen, Mario Lanza

Physical Sciences and Engineering

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Determining the thickness of two-dimensional (2D) materials accurately and reliably is highly necessary for multiple investigations, but at the same time it can be quite complex. Most studies in this field measure a topographic map at the edge of the 2D material using an atomic force microscope (AFM), and plot a single-line cross-section using the software of the AFM. However, this method is highly inaccurate and can result in high relative errors due to surface roughness and line-to-line variability. This is even more important in ultrathin (

Original language	English (US)
Pages (from-to)	2100056
Journal	Crystal Research and Technology
DOIs	https://doi.org/10.1002/crat.202100056
State	Published - May 6 2021

ASJC Scopus subject areas

General Materials Science
General Chemistry
Condensed Matter Physics

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10.1002/crat.202100056

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@article{05b47dd50bf8469d83e4d185bf903a1c,

title = "Highly Accurate Thickness Determination of 2D Materials",

abstract = "Determining the thickness of two-dimensional (2D) materials accurately and reliably is highly necessary for multiple investigations, but at the same time it can be quite complex. Most studies in this field measure a topographic map at the edge of the 2D material using an atomic force microscope (AFM), and plot a single-line cross-section using the software of the AFM. However, this method is highly inaccurate and can result in high relative errors due to surface roughness and line-to-line variability. This is even more important in ultrathin (",

author = "Yiping Xiao and Wenwen Zheng and Bin Yuan and Chao Wen and Mario Lanza",

note = "KAUST Repository Item: Exported on 2021-05-10 Acknowledgements: This work was supported by the Ministry of Science and Technology of China (Grant Nos. 2018YFE0100800 and 2019YFE0124200), the National Natural Science Foundation of China (Grant No. 61874075), the Collaborative Innovation Centre of Suzhou Nano Science & Technology, the Priority Academic Program Development of Jiangsu Higher Education Institutions, and the 111 Project from the State Administration of Foreign Experts Affairs of China.",

year = "2021",

month = may,

day = "6",

doi = "10.1002/crat.202100056",

language = "English (US)",

pages = "2100056",

journal = "Crystal Research and Technology",

issn = "0232-1300",

publisher = "John Wiley and Sons Inc.",

}

TY - JOUR

T1 - Highly Accurate Thickness Determination of 2D Materials

AU - Xiao, Yiping

AU - Zheng, Wenwen

AU - Yuan, Bin

AU - Wen, Chao

AU - Lanza, Mario

N1 - KAUST Repository Item: Exported on 2021-05-10 Acknowledgements: This work was supported by the Ministry of Science and Technology of China (Grant Nos. 2018YFE0100800 and 2019YFE0124200), the National Natural Science Foundation of China (Grant No. 61874075), the Collaborative Innovation Centre of Suzhou Nano Science & Technology, the Priority Academic Program Development of Jiangsu Higher Education Institutions, and the 111 Project from the State Administration of Foreign Experts Affairs of China.

PY - 2021/5/6

Y1 - 2021/5/6

N2 - Determining the thickness of two-dimensional (2D) materials accurately and reliably is highly necessary for multiple investigations, but at the same time it can be quite complex. Most studies in this field measure a topographic map at the edge of the 2D material using an atomic force microscope (AFM), and plot a single-line cross-section using the software of the AFM. However, this method is highly inaccurate and can result in high relative errors due to surface roughness and line-to-line variability. This is even more important in ultrathin (

AB - Determining the thickness of two-dimensional (2D) materials accurately and reliably is highly necessary for multiple investigations, but at the same time it can be quite complex. Most studies in this field measure a topographic map at the edge of the 2D material using an atomic force microscope (AFM), and plot a single-line cross-section using the software of the AFM. However, this method is highly inaccurate and can result in high relative errors due to surface roughness and line-to-line variability. This is even more important in ultrathin (

UR - http://hdl.handle.net/10754/669130

UR - https://onlinelibrary.wiley.com/doi/10.1002/crat.202100056

U2 - 10.1002/crat.202100056

DO - 10.1002/crat.202100056

M3 - Article

SN - 0232-1300

SP - 2100056

JO - Crystal Research and Technology

JF - Crystal Research and Technology

ER -

Highly Accurate Thickness Determination of 2D Materials

Abstract

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