History and Status of the CAFM

Chengbin Pan; Yuanyuan Shi; Fei Hui; Enric Grustan-Gutierrez; Mario Lanza

doi:10.1002/9783527699773.ch1

History and Status of the CAFM

Chengbin Pan, Yuanyuan Shi, Fei Hui, Enric Grustan-Gutierrez, Mario Lanza

Physical Sciences and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

14 Scopus citations

Abstract

The conductive atomic force microscope (CAFM) records the currents flowing at the tip/sample nanojunction simultaneously to the topography. The CAFM can be used to monitor the properties of materials, as well as to modify them with atomic resolution. The CAFM became a very popular tool in the field of characterization of thin dielectrics. In particular, the CAFM is especially useful to determine which locations of the samples lead to premature breakdown (BD), which can provide essential information about the reliability of the samples. The use of CAFM for the characterization of thin dielectrics has been recently extended to the field of 2D dielectrics. This chapter presents the use of CAFM for the investigation of piezoelectric nanowires (NWs). New CAFM developments include multiprobe setups and their in situ combination with other techniques, which confirms a very promising panorama for CAFM based techniques.

Original language	English (US)
Title of host publication	Conductive Atomic Force Microscopy
Subtitle of host publication	Applications in Nanomaterials
Publisher	Wiley
Pages	1-28
Number of pages	28
ISBN (Electronic)	9783527699773
ISBN (Print)	9783527340910
DOIs	https://doi.org/10.1002/9783527699773.ch1
State	Published - Jan 1 2017

Keywords

2D dielectrics
atomic resolution
conductive atomic force microscope
dielectric breakdown
materials science
piezoelectric nanowires
thin dielectrics

ASJC Scopus subject areas

General Chemistry

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10.1002/9783527699773.ch1

Cite this

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AU - Hui, Fei

AU - Grustan-Gutierrez, Enric

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History and Status of the CAFM

Abstract

Keywords

ASJC Scopus subject areas

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