Hot carrier degradation in HfSiONTiN fin shaped field effect transistor with different substrate orientations

Chadwin D. Young, Ji Woon Yang, Kenneth Matthews, Sagar Suthram, Muhammad Mustafa Hussain, Gennadi Bersuker, Casey Smith, Rusty Harris, Rino Choi, Byoung Hun Lee, Hsing Huang Tseng

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

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