Impact of Dead Times on Radiated Emissions of Integrated and Discrete DC-DC Converter

Josip Bacmaga, Raul Blecic, Fabio Pareschi, Gianluca Setti, Adrijan Baric

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

An integrated synchronous buck converter, designed in a 0.18-m high-voltage CMOS technology, is analyzed to investigate the impact of the dead times between the control signals on the radiated emissions. The designed converter enables to set the dead times of the control signals for both integrated or off-chip transistor switches. The test boards are designed to analyze the impact of dead times on radiated emissions for integrated and discrete synchronous buck converter. The radiated emissions of both integrated and discrete converter are measured in a semi-anechoic chamber.
Original languageEnglish (US)
Title of host publicationEMC COMPO 2019 - 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages266-268
Number of pages3
ISBN (Print)9781728142616
DOIs
StatePublished - Oct 1 2019
Externally publishedYes

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