INIS
concentration
100%
films
100%
gallium nitrides
100%
resolution
40%
transmission electron microscopy
40%
energy
20%
layers
20%
interfaces
20%
growth
20%
distance
20%
images
20%
increasing
20%
epitaxy
20%
electron diffraction
20%
x-ray spectroscopy
20%
Physics
Plane
100%
High Resolution
66%
Transmission Electron Microscopy
66%
Growth
66%
Structural Analysis
66%
X Ray Spectroscopy
33%
Electron Diffraction
33%
Electron Energy
33%
Increasing
33%
Distance
33%
Images
33%
Material Science
Film
100%
High-Resolution Transmission Electron Microscopy
100%
Structural Analysis
100%
Epitaxy
50%
Electron Diffraction
50%
Energy-Dispersive X-Ray Spectroscopy
50%