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In situ TEM and energy dispersion spectrometer analysis of chemical composition change in ZnO nanowire resistive memories
Yu Ting Huang, Shih Ying Yu, Cheng Lun Hsin, Chun Wei Huang, Chen Fang Kang, Fu Hsuan Chu, Jui Yuan Chen, Jung Chih Hu, Lien Tai Chen, Jr-Hau He, Wen Wei Wu*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
39
Scopus
citations