Independent Component Analysis Using RRAMs

Mohammed E. Fouda, Emre Neftci, Ahmed Eltawil, Fadi Kurdahi

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Resistive random-access memories (RRAM)s are considered a promising candidate for neuromorphic circuits and systems. In this letter, we investigate using TiO-2 RRAMs to solve blind source separation problem through independent component analysis (ICA) for the first time. ICA has numerous uses including feature extraction. We deploy a local, unsupervised learning algorithm (error-gated Hebbian rule) to extract the independent components. The online evaluation of the weights during the training is studied taking into consideration the asymmetric nonlinear weight update behavior. The effects of the device variability are considered in the results. Finally, an example of de-mixing two Laplacian signals is given to demonstrate the efficacy of the approach.
Original languageEnglish (US)
JournalIEEE Transactions on Nanotechnology
Volume18
DOIs
StatePublished - Jan 1 2019
Externally publishedYes

Fingerprint

Dive into the research topics of 'Independent Component Analysis Using RRAMs'. Together they form a unique fingerprint.

Cite this