Infrared reflectivity of Cox(SiO2)1-x (x∼0.85, 0.55, 0.38) granular films on SiO2 glass substrates

Néstor E. Massa; Juliano C. Denardin; Leandro M. Socolovsky; Marcelo Knobel; Fernando Pablo de la Cruz; Xixiang Zhang

doi:10.1016/j.ssc.2006.12.019

Infrared reflectivity of Co_x(SiO₂)_1-x (x∼0.85, 0.55, 0.38) granular films on SiO₂ glass substrates

Néstor E. Massa^*, Juliano C. Denardin, Leandro M. Socolovsky, Marcelo Knobel, Fernando Pablo de la Cruz, Xixiang Zhang

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

We report the infrared specular reflectivity of Co_x(SiO₂)_1-x (x ∼ 0.85, 0.55, 0.38) films on SiO₂ glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.

Original language	English (US)
Pages (from-to)	551-554
Number of pages	4
Journal	Solid State Communications
Volume	141
Issue number	10
DOIs	https://doi.org/10.1016/j.ssc.2006.12.019
State	Published - Mar 2007
Externally published	Yes

Keywords

A. Granular films
D. Electron-phonon interactions
D. Optical properties
E. Light absorption and reflection

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
Materials Chemistry

Access to Document

10.1016/j.ssc.2006.12.019

Cite this

@article{cbee56f044a14ec9a0220801f83a69ec,

title = "Infrared reflectivity of Cox(SiO2)1-x (x∼0.85, 0.55, 0.38) granular films on SiO2 glass substrates",

abstract = "We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.",

keywords = "A. Granular films, D. Electron-phonon interactions, D. Optical properties, E. Light absorption and reflection",

author = "Massa, {N{\'e}stor E.} and Denardin, {Juliano C.} and Socolovsky, {Leandro M.} and Marcelo Knobel and {de la Cruz}, {Fernando Pablo} and Xixiang Zhang",

year = "2007",

month = mar,

doi = "10.1016/j.ssc.2006.12.019",

language = "English (US)",

volume = "141",

pages = "551--554",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Ltd",

number = "10",

}

TY - JOUR

T1 - Infrared reflectivity of Cox(SiO2)1-x (x∼0.85, 0.55, 0.38) granular films on SiO2 glass substrates

AU - Massa, Néstor E.

AU - Denardin, Juliano C.

AU - Socolovsky, Leandro M.

AU - Knobel, Marcelo

AU - de la Cruz, Fernando Pablo

AU - Zhang, Xixiang

PY - 2007/3

Y1 - 2007/3

N2 - We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.

AB - We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.

KW - A. Granular films

KW - D. Electron-phonon interactions

KW - D. Optical properties

KW - E. Light absorption and reflection

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DO - 10.1016/j.ssc.2006.12.019

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SN - 0038-1098

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JO - Solid State Communications

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