Inkjet-printed organic electronics: Operational stability and reliability issues

M. C.R. Medeiros; C. Martinez-Domingo; E. Ramon; A. T. Negrier; E. Sowade; K. Y. Mitra; R. R. Baumann; I. McCulloch; J. Carrabina; H. L. Gomes

doi:10.1149/05326.0001ecst

Inkjet-printed organic electronics: Operational stability and reliability issues

M. C.R. Medeiros, C. Martinez-Domingo, E. Ramon, A. T. Negrier, E. Sowade, K. Y. Mitra, R. R. Baumann, I. McCulloch, J. Carrabina, H. L. Gomes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×10³ s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water.

Original language	English (US)
Title of host publication	Organic Semiconductor Materials, Devices, and Processing 4
Publisher	Electrochemical Society Inc.
Pages	1-10
Number of pages	10
Edition	26
ISBN (Print)	9781607684787
DOIs	https://doi.org/10.1149/05326.0001ecst
State	Published - 2013
Externally published	Yes
Event	Symposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society - Toronto, ON, Canada Duration: May 12 2013 → May 16 2013

Publication series

Name	ECS Transactions
Number	26
Volume	53
ISSN (Print)	1938-5862
ISSN (Electronic)	1938-6737

Other

Other	Symposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society
Country/Territory	Canada
City	Toronto, ON
Period	05/12/13 → 05/16/13

ASJC Scopus subject areas

General Engineering

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10.1149/05326.0001ecst

Cite this

Medeiros, M. C. R., Martinez-Domingo, C., Ramon, E., Negrier, A. T., Sowade, E., Mitra, K. Y., Baumann, R. R., McCulloch, I., Carrabina, J., & Gomes, H. L. (2013). Inkjet-printed organic electronics: Operational stability and reliability issues. In Organic Semiconductor Materials, Devices, and Processing 4 (26 ed., pp. 1-10). (ECS Transactions; Vol. 53, No. 26). Electrochemical Society Inc.. https://doi.org/10.1149/05326.0001ecst

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title = "Inkjet-printed organic electronics: Operational stability and reliability issues",

abstract = "The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water.",

author = "Medeiros, {M. C.R.} and C. Martinez-Domingo and E. Ramon and Negrier, {A. T.} and E. Sowade and Mitra, {K. Y.} and Baumann, {R. R.} and I. McCulloch and J. Carrabina and Gomes, {H. L.}",

year = "2013",

doi = "10.1149/05326.0001ecst",

language = "English (US)",

isbn = "9781607684787",

series = "ECS Transactions",

publisher = "Electrochemical Society Inc.",

number = "26",

pages = "1--10",

booktitle = "Organic Semiconductor Materials, Devices, and Processing 4",

edition = "26",

note = "Symposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society ; Conference date: 12-05-2013 Through 16-05-2013",

}

Medeiros, MCR, Martinez-Domingo, C, Ramon, E, Negrier, AT, Sowade, E, Mitra, KY, Baumann, RR, McCulloch, I, Carrabina, J & Gomes, HL 2013, Inkjet-printed organic electronics: Operational stability and reliability issues. in Organic Semiconductor Materials, Devices, and Processing 4. 26 edn, ECS Transactions, no. 26, vol. 53, Electrochemical Society Inc., pp. 1-10, Symposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society, Toronto, ON, Canada, 05/12/13. https://doi.org/10.1149/05326.0001ecst

Inkjet-printed organic electronics: Operational stability and reliability issues. / Medeiros, M. C.R.; Martinez-Domingo, C.; Ramon, E. et al.
Organic Semiconductor Materials, Devices, and Processing 4. 26. ed. Electrochemical Society Inc., 2013. p. 1-10 (ECS Transactions; Vol. 53, No. 26).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Baumann, R. R.

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AB - The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water.

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PB - Electrochemical Society Inc.

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ER -

Inkjet-printed organic electronics: Operational stability and reliability issues

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