TY - JOUR
T1 - Interface relaxation and electrostatic charge depletion in the oxide heterostructure LaAlO3/SrTiO3
AU - Schwingenschlögl, U.
AU - Schuster, C.
PY - 2009
Y1 - 2009
N2 - Performing an analysis within density functional theory, we develop insight into the structural and electronic properties of the oxide heterostructure LaAlO3/SrTiO3. Electrostatic surface effects are decomposed from the internal lattice distortion in order to clarify their interplay. We first study the interface relaxation by a multi-layer system without surface, and the surface effects, separately, by a substrate-film system. While elongation of the TiO6 octahedra at the interface enhances the metallicity, reduction of the film thickness has the opposite effect due to a growing charge depletion. The interplay of these two effects, as reflected by the full lattice relaxation in the substrate-film system, however, strongly depends on the film thickness. An inversion of the TiO6 distortion pattern for films thinner than four LaAlO3 layers results in an insulating state.
AB - Performing an analysis within density functional theory, we develop insight into the structural and electronic properties of the oxide heterostructure LaAlO3/SrTiO3. Electrostatic surface effects are decomposed from the internal lattice distortion in order to clarify their interplay. We first study the interface relaxation by a multi-layer system without surface, and the surface effects, separately, by a substrate-film system. While elongation of the TiO6 octahedra at the interface enhances the metallicity, reduction of the film thickness has the opposite effect due to a growing charge depletion. The interplay of these two effects, as reflected by the full lattice relaxation in the substrate-film system, however, strongly depends on the film thickness. An inversion of the TiO6 distortion pattern for films thinner than four LaAlO3 layers results in an insulating state.
UR - http://www.scopus.com/inward/record.url?scp=70449650017&partnerID=8YFLogxK
U2 - 10.1209/0295-5075/86/27005
DO - 10.1209/0295-5075/86/27005
M3 - Article
AN - SCOPUS:70449650017
SN - 0295-5075
VL - 86
JO - EPL
JF - EPL
IS - 2
M1 - 27005
ER -