Abstract
We investigate device performance of InGaN light-emitting diodes with a 30-nm p-GaN layer. The metallization used to separate the p-contact from plasmonic metals, reveals limitations on current spreading which reduces surface plasmonic enhancement.
Original language | English (US) |
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Title of host publication | Optics InfoBase Conference Papers |
Publisher | Optica Publishing Group (formerly OSA) |
State | Published - Jan 1 2016 |
Externally published | Yes |