Abstract
For bit-patterned media, media with low remanent magnetization (M r) and high M r regions are needed for storing information, which is usually achieved by lithographically defining magnetic and non-magnetic regions. In this work, we have investigated the use of ion beam modification of media surface to define the low and high M r states using a medium that is at a low M r state to start with. The low M r state is achieved by the use of synthetic antiferromagnetic coupling obtained in Co-alloy/Ru/Co-alloy trilayer structured film. Local ion beam modification at 30 keV energy using Ga ions was used to create high M r regions. AFM and MFM observations indicated that patterned regions of low and high M r can be observed with ion beam irradiation. This technique is a potential method to achieve patterned media without the need of planarization techniques.
Original language | English (US) |
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Pages (from-to) | 2611-2614 |
Number of pages | 4 |
Journal | Journal of nanoscience and nanotechnology |
Volume | 11 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2011 |
Keywords
- Antiferromagnetically coupled media
- Focused ion beam
- Magnetic materials
- Nanofabrication
- Patterning
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Bioengineering
- Biomedical Engineering
- General Materials Science