TY - GEN
T1 - Leakage current analysis in AlGaInP/GaInP multi-quantum well lasers by the electrical derivative method
AU - Xu, Yun
AU - Li, Yuzhang
AU - Song, Guofeng
AU - Gan, Qiaoqiang
AU - Cao, Qing
AU - Guo, Liang
AU - Chen, Lianghui
N1 - Generated from Scopus record by KAUST IRTS on 2022-09-13
PY - 2005/12/1
Y1 - 2005/12/1
N2 - In AlGaInP/GaInP multi-quantum well (MQW) lasers, the electron leakage current is a much more serious problem than that in laser diodes with longer wavelength. To further improve the output performance, the leakage current should be analyzed. In this letter, the temperature dependence of electrical derivative characteristics in AlGaInP/GaInP multi-quantum well lasers was measured, and the potential barrier for electron leakage was obtained. With the help of secondary ion mass spectroscopy (SIMS) measurement, theoretical analysis of the potential barrier was presented and compared with the measurement result. The influence of p-cladding doping level and doping profile on the potential barrier was discussed, and this can be helpful in metalorganic chemical vapor deposition (MOCVD) growth.
AB - In AlGaInP/GaInP multi-quantum well (MQW) lasers, the electron leakage current is a much more serious problem than that in laser diodes with longer wavelength. To further improve the output performance, the leakage current should be analyzed. In this letter, the temperature dependence of electrical derivative characteristics in AlGaInP/GaInP multi-quantum well lasers was measured, and the potential barrier for electron leakage was obtained. With the help of secondary ion mass spectroscopy (SIMS) measurement, theoretical analysis of the potential barrier was presented and compared with the measurement result. The influence of p-cladding doping level and doping profile on the potential barrier was discussed, and this can be helpful in metalorganic chemical vapor deposition (MOCVD) growth.
UR - http://proceedings.spiedigitallibrary.org/proceeding.aspx?doi=10.1117/12.636130
UR - http://www.scopus.com/inward/record.url?scp=33644978106&partnerID=8YFLogxK
U2 - 10.1117/12.636130
DO - 10.1117/12.636130
M3 - Conference contribution
BT - Proceedings of SPIE - The International Society for Optical Engineering
ER -