Lithium fluoride coloration by laser-plasma soft x-rays: A promising tool for X-ray microscopy and photonics

Francesco Flora*, Giuseppe Baldacchini, Francesca Bonfigli, Antonella Lai, Tiziana Marolo, Luca Mezi, Rosa Maria Montereali, Daniele Murra, Nicola Lisi, Enrico Nichelatti, Anatoly Ya Faenov, Tatiana A. Pikuz, Libero Palladino, Armando Reale, Antonio Ritucci, Lucia Reale, Giuseppe Tomassetti, Pasquale Fabi, Tania Limongi

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations

Abstract

A new imaging detector for EUV or soft-X-ray radiation based on optically stimulated luminescence (OSL) of lithium fluoride (LiF) films or crystals is presented. The first micro-radiography images of biological samples and of meshes obtained on LiF using a laser-plasma source or an X-ray laser are shown, and (up to now) a resolution better than one micron is demonstrated. The dependence of the coloration density vs the deposited X-ray dose is considered and the advantages of this new diagnostic technique for both coherent and non-coherent EUV sources, compared with CCDs detectors, photographic films and photoresists are discussed. This new detector is extremely suitable for laser plasmas and for X-ray lasers sources.

Original languageEnglish (US)
Pages (from-to)298-310
Number of pages13
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5196
DOIs
StatePublished - 2004
Externally publishedYes
EventLaser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications - San Diego, CA, United States
Duration: Aug 4 2003Aug 6 2003

Keywords

  • EUV radiation
  • Imaging
  • Lithium fluoride
  • X-ray detectors
  • X-ray microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Applied Mathematics
  • Electrical and Electronic Engineering
  • Computer Science Applications

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