Measurement of Cohesion and Adhesion of Semiconducting Polymers by Scratch Testing: Effect of Side-Chain Length and Degree of Polymerization

Daniel Rodriquez, James G. Kohl, Pierre Morel, Kyle Burrows, Grégory Favaro, Samuel E. Root, Julian Ramírez, Mohammad A. Alkhadra, Cody W. Carpenter, Zhuping Fei, Pierre Boufflet, Martin Heeney, Darren J. Lipomi

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

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Material Science

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