Mechanical Reliability of Fullerene/Tin Oxide Interfaces in Monolithic Perovskite/Silicon Tandem Cells

Michele de Bastiani, Giovanni Armaroli, Rawan S. Jalmood, Laura Ferlauto, Xiaole Li, Ran Tao, George T. Harrison, Mathan Kumar Eswaran, Randi Azmi, Maxime Babics, Anand Selvin Subbiah, Erkan Aydin, Thomas Allen, Craig Combe, Tobias Cramer, Derya Baran, Udo Schwingenschlögl, Gilles Lubineau, Daniela Cavalcoli, Stefaan De Wolf

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