Keyphrases
Solution Process
100%
Silica
100%
Aluminum Oxide
100%
Memory Effect
100%
Ultrasmall
100%
2-structure
100%
Si Nanoparticles
100%
Memory Structure
50%
Sweeping
25%
Silica Nanoparticles (SiNPs)
25%
Tunneling
25%
Energy Band Diagram
25%
Hysteresis Measurements
25%
3-layer
25%
Gate Voltage
25%
P-type
25%
Threshold Voltage
25%
Non-volatile Memory
25%
Cycle Retention
25%
Negative Shift
25%
High-k Dielectric
25%
Long Retention Time
25%
Atomic Layer Deposited
25%
C-V Measurement
25%
CV Curve
25%
Fowler-Nordheim Tunneling
25%
Good Endurance
25%
SiO2 Layer
25%
Endurance Characteristics
25%
Engineering
Si Nanoparticles
100%
Memory Effect
100%
Energy Band Diagram
25%
Nonvolatile Memory
25%
Gate Voltage
25%
Atomic Layer
25%
Dielectrics
25%
Retention Time
25%
Silicon Nanoparticle
25%
Fowler-Nordheim Tunneling
25%
Material Science
Nanoparticle
100%
Memory Effect
100%
Dielectric Material
20%