Metasurface Augmented Camera for General Optical Metrology Applications

A. Burguete-Lopez; M. Makarenko; Q. Wang; F. Getman; A. Fratalocchi

Metasurface Augmented Camera for General Optical Metrology Applications

A. Burguete-Lopez^*, M. Makarenko, Q. Wang, F. Getman, A. Fratalocchi

^*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

Abstract

We present a general optical metrology platform that employs an information processing metasurface as the means for the measurement of observables. The approach, consisting of combining an information processing metasurface with an off-the-shelf CMOS sensor, permits rapid characterization of the properties of materials in a cost-effective and mass-producible package. We present initial results on the fabrication of a prototype of this system.

Original language	English (US)
Pages	1555-1556
Number of pages	2
State	Published - 2023
Event	13th International Conference on Metamaterials, Photonic Crystals and Plasmonics, META 2023 - Paris, France Duration: Jul 18 2023 → Jul 21 2023

Conference

Conference	13th International Conference on Metamaterials, Photonic Crystals and Plasmonics, META 2023
Country/Territory	France
City	Paris
Period	07/18/23 → 07/21/23

ASJC Scopus subject areas

Electrical and Electronic Engineering
Materials Science (miscellaneous)
Electronic, Optical and Magnetic Materials
Materials Chemistry

Cite this

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title = "Metasurface Augmented Camera for General Optical Metrology Applications",

abstract = "We present a general optical metrology platform that employs an information processing metasurface as the means for the measurement of observables. The approach, consisting of combining an information processing metasurface with an off-the-shelf CMOS sensor, permits rapid characterization of the properties of materials in a cost-effective and mass-producible package. We present initial results on the fabrication of a prototype of this system.",

author = "A. Burguete-Lopez and M. Makarenko and Q. Wang and F. Getman and A. Fratalocchi",

note = "Publisher Copyright: {\textcopyright} 2023, META Conference. All rights reserved.; 13th International Conference on Metamaterials, Photonic Crystals and Plasmonics, META 2023 ; Conference date: 18-07-2023 Through 21-07-2023",

year = "2023",

language = "English (US)",

pages = "1555--1556",

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TY - CONF

T1 - Metasurface Augmented Camera for General Optical Metrology Applications

AU - Burguete-Lopez, A.

AU - Makarenko, M.

AU - Wang, Q.

AU - Getman, F.

AU - Fratalocchi, A.

PY - 2023

Y1 - 2023

N2 - We present a general optical metrology platform that employs an information processing metasurface as the means for the measurement of observables. The approach, consisting of combining an information processing metasurface with an off-the-shelf CMOS sensor, permits rapid characterization of the properties of materials in a cost-effective and mass-producible package. We present initial results on the fabrication of a prototype of this system.

AB - We present a general optical metrology platform that employs an information processing metasurface as the means for the measurement of observables. The approach, consisting of combining an information processing metasurface with an off-the-shelf CMOS sensor, permits rapid characterization of the properties of materials in a cost-effective and mass-producible package. We present initial results on the fabrication of a prototype of this system.

UR - http://www.scopus.com/inward/record.url?scp=85174571231&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:85174571231

SP - 1555

EP - 1556

T2 - 13th International Conference on Metamaterials, Photonic Crystals and Plasmonics, META 2023

Y2 - 18 July 2023 through 21 July 2023

ER -

Metasurface Augmented Camera for General Optical Metrology Applications

Abstract

Conference

ASJC Scopus subject areas

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