TY - GEN
T1 - Metrology System Based on Metasurface Implementation of Artificial Inteligence
AU - Burguete-Lopez, Arturo
AU - Makarenko, Maksim
AU - Wang, Qizhou
AU - Getman, Fedor
AU - Fratalocchi, Andrea
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3-5].
AB - Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3-5].
UR - http://www.scopus.com/inward/record.url?scp=85175704617&partnerID=8YFLogxK
U2 - 10.1109/CLEO/EUROPE-EQEC57999.2023.10231970
DO - 10.1109/CLEO/EUROPE-EQEC57999.2023.10231970
M3 - Conference contribution
AN - SCOPUS:85175704617
T3 - 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
BT - 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
Y2 - 26 June 2023 through 30 June 2023
ER -