MFM study of magnetic bit patterns of different dimensions

Dan You, Yuankai Zheng, Zhiyong Liu, Zaibing Guo, Yihong Wu

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


    The focused ion beam (FIB) technique was utilized to pattern the commercial post-sputtering longitudinal recording media into individual bits of different dimensions. A number of horizontal and vertical lines were milled to separate the bits. The MFM observation was employed to study the magnetic property of each bit and the interaction between "transitions" created by the discontinuity of magnetization at the edges of bits. The single domain structures were formed spontaneously as the bit dimension is reduced to 200 nm or less. We demonstrate the new interplay between the magnetostatic energy and exchange energy for patterned media bits.

    Original languageEnglish (US)
    Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
    EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)0780373650, 9780780373655
    StatePublished - Jan 1 2002
    Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
    Duration: Apr 28 2002May 2 2002


    Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering
    • Surfaces, Coatings and Films


    Dive into the research topics of 'MFM study of magnetic bit patterns of different dimensions'. Together they form a unique fingerprint.

    Cite this