Micron-scale patterning of high conductivity poly(3,4- ethylendioxythiophene):poly(styrenesulfonate) for organic field-effect transistors

Dong Seok Leem, Paul H. Wöbkenberg, Jingsong Huang, Thomas D. Anthopoulos, Donal D.C. Bradley, John C. De Mello

Research output: Contribution to journalArticlepeer-review

33 Scopus citations

Fingerprint

Dive into the research topics of 'Micron-scale patterning of high conductivity poly(3,4- ethylendioxythiophene):poly(styrenesulfonate) for organic field-effect transistors'. Together they form a unique fingerprint.

Material Science

Keyphrases