TY - GEN
T1 - Model-based fault detection algorithm for photovoltaic system monitoring
AU - Harrou, Fouzi
AU - Sun, Ying
AU - Saidi, Ahmed
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/1
Y1 - 2017/7/1
N2 - Reliable detection of faults in PV systems plays an important role in improving their reliability, productivity, and safety. This paper addresses the detection of faults in the direct current (DC) side of photovoltaic (PV) systems using a statistical approach. Specifically, a simulation model that mimics the theoretical performances of the inspected PV system is designed. Residuals, which are the difference between the measured and estimated output data, are used as a fault indicator. Indeed, residuals are used as the input for the Multivariate CUmulative SUM (MCUSUM) algorithm to detect potential faults. We evaluated the proposed method by using data from an actual 20 MWp grid-connected PV system located in the province of Adrar, Algeria.
AB - Reliable detection of faults in PV systems plays an important role in improving their reliability, productivity, and safety. This paper addresses the detection of faults in the direct current (DC) side of photovoltaic (PV) systems using a statistical approach. Specifically, a simulation model that mimics the theoretical performances of the inspected PV system is designed. Residuals, which are the difference between the measured and estimated output data, are used as a fault indicator. Indeed, residuals are used as the input for the Multivariate CUmulative SUM (MCUSUM) algorithm to detect potential faults. We evaluated the proposed method by using data from an actual 20 MWp grid-connected PV system located in the province of Adrar, Algeria.
UR - http://www.scopus.com/inward/record.url?scp=85046121748&partnerID=8YFLogxK
U2 - 10.1109/SSCI.2017.8285435
DO - 10.1109/SSCI.2017.8285435
M3 - Conference contribution
AN - SCOPUS:85046121748
T3 - 2017 IEEE Symposium Series on Computational Intelligence, SSCI 2017 - Proceedings
SP - 1
EP - 5
BT - 2017 IEEE Symposium Series on Computational Intelligence, SSCI 2017 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE Symposium Series on Computational Intelligence, SSCI 2017
Y2 - 27 November 2017 through 1 December 2017
ER -