TY - GEN
T1 - Multiview specular stereo reconstruction of large mirror surfaces
AU - Balzer, Jonathan
AU - Höler, Sebastian
AU - Beyerer, Jürgen
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2011/6
Y1 - 2011/6
N2 - In deflectometry, the shape of mirror objects is recovered from distorted images of a calibrated scene. While remarkably high accuracies are achievable, state-of-the-art methods suffer from two distinct weaknesses: First, for mainly constructive reasons, these can only capture a few square centimeters of surface area at once. Second, reconstructions are ambiguous i.e. infinitely many surfaces lead to the same visual impression. We resolve both of these problems by introducing the first multiview specular stereo approach, which jointly evaluates a series of overlapping deflectometric images. Two publicly available benchmarks accompany this paper, enabling us to numerically demonstrate viability and practicability of our approach. © 2011 IEEE.
AB - In deflectometry, the shape of mirror objects is recovered from distorted images of a calibrated scene. While remarkably high accuracies are achievable, state-of-the-art methods suffer from two distinct weaknesses: First, for mainly constructive reasons, these can only capture a few square centimeters of surface area at once. Second, reconstructions are ambiguous i.e. infinitely many surfaces lead to the same visual impression. We resolve both of these problems by introducing the first multiview specular stereo approach, which jointly evaluates a series of overlapping deflectometric images. Two publicly available benchmarks accompany this paper, enabling us to numerically demonstrate viability and practicability of our approach. © 2011 IEEE.
UR - http://hdl.handle.net/10754/564391
UR - https://ieeexplore.ieee.org/document/5995346/
UR - http://www.scopus.com/inward/record.url?scp=80052911153&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2011.5995346
DO - 10.1109/CVPR.2011.5995346
M3 - Conference contribution
SN - 9781457703942
SP - 2537
EP - 2544
BT - CVPR 2011
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -