Nanometer focusing of hard x rays by phase zone plates

W. Yun; B. Lai; Z. Cai; J. Maser; D. Legnini; E. Gluskin; Z. Chen; A. A. Krasnoperova; Y. Vladimirsky; F. Cerrina; E. Di Fabrizio; M. Gentili

doi:10.1063/1.1149744

Nanometer focusing of hard x rays by phase zone plates

W. Yun^*, B. Lai, Z. Cai, J. Maser, D. Legnini, E. Gluskin, Z. Chen, A. A. Krasnoperova, Y. Vladimirsky, F. Cerrina, E. Di Fabrizio, M. Gentili

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

214 Scopus citations

Abstract

Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respectively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabrication of the PZP and its experimental characterization are presented and some special applications are discussed.

Original language	English (US)
Pages (from-to)	2238-2241
Number of pages	4
Journal	Review of Scientific Instruments
Volume	70
Issue number	5
DOIs	https://doi.org/10.1063/1.1149744
State	Published - 1999
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1149744

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title = "Nanometer focusing of hard x rays by phase zone plates",

abstract = "Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respectively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabrication of the PZP and its experimental characterization are presented and some special applications are discussed.",

author = "W. Yun and B. Lai and Z. Cai and J. Maser and D. Legnini and E. Gluskin and Z. Chen and Krasnoperova, {A. A.} and Y. Vladimirsky and F. Cerrina and {Di Fabrizio}, E. and M. Gentili",

year = "1999",

doi = "10.1063/1.1149744",

language = "English (US)",

volume = "70",

pages = "2238--2241",

journal = "Review of Scientific Instruments",

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publisher = "AIP Publishing",

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TY - JOUR

T1 - Nanometer focusing of hard x rays by phase zone plates

AU - Yun, W.

AU - Lai, B.

AU - Cai, Z.

AU - Maser, J.

AU - Legnini, D.

AU - Gluskin, E.

AU - Chen, Z.

AU - Krasnoperova, A. A.

AU - Vladimirsky, Y.

AU - Cerrina, F.

AU - Di Fabrizio, E.

AU - Gentili, M.

PY - 1999

Y1 - 1999

N2 - Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respectively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabrication of the PZP and its experimental characterization are presented and some special applications are discussed.

AB - Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respectively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabrication of the PZP and its experimental characterization are presented and some special applications are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0001547240&partnerID=8YFLogxK

U2 - 10.1063/1.1149744

DO - 10.1063/1.1149744

M3 - Article

AN - SCOPUS:0001547240

SN - 0034-6748

VL - 70

SP - 2238

EP - 2241

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 5

ER -

Nanometer focusing of hard x rays by phase zone plates

Abstract

ASJC Scopus subject areas

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