TY - GEN
T1 - Nonlinear partial least squares with Hellinger distance for nonlinear process monitoring
AU - Harrou, Fouzi
AU - Madakyaru, Muddu
AU - Sun, Ying
N1 - KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): OSR-2015-CRG4-2582
Acknowledgements: This publication is based upon work supported by the King Abdullah University of Science and Technology (KAUST) Office of Sponsored Research (OSR) under Award No: OSR-2015-CRG4-2582.
PY - 2017/2/16
Y1 - 2017/2/16
N2 - This paper proposes an efficient data-based anomaly detection method that can be used for monitoring nonlinear processes. The proposed method merges advantages of nonlinear projection to latent structures (NLPLS) modeling and those of Hellinger distance (HD) metric to identify abnormal changes in highly correlated multivariate data. Specifically, the HD is used to quantify the dissimilarity between current NLPLS-based residual and reference probability distributions. The performances of the developed anomaly detection using NLPLS-based HD technique is illustrated using simulated plug flow reactor data.
AB - This paper proposes an efficient data-based anomaly detection method that can be used for monitoring nonlinear processes. The proposed method merges advantages of nonlinear projection to latent structures (NLPLS) modeling and those of Hellinger distance (HD) metric to identify abnormal changes in highly correlated multivariate data. Specifically, the HD is used to quantify the dissimilarity between current NLPLS-based residual and reference probability distributions. The performances of the developed anomaly detection using NLPLS-based HD technique is illustrated using simulated plug flow reactor data.
UR - http://hdl.handle.net/10754/623873
UR - http://ieeexplore.ieee.org/document/7849878/
UR - http://www.scopus.com/inward/record.url?scp=85016073168&partnerID=8YFLogxK
U2 - 10.1109/SSCI.2016.7849878
DO - 10.1109/SSCI.2016.7849878
M3 - Conference contribution
SN - 9781509042401
BT - 2016 IEEE Symposium Series on Computational Intelligence (SSCI)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -