Abstract
This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is easily estimated through a novel gain calibration technique. Finally, near to far field transformation is employed to extract full radiation patterns.
| Original language | English (US) |
|---|---|
| Title of host publication | IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference |
| Pages | 463-466 |
| Number of pages | 4 |
| Volume | 1 |
| State | Published - 2005 |
| Externally published | Yes |
| Event | IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference - Ottawa, ON, Canada Duration: May 16 2005 → May 19 2005 |
Other
| Other | IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference |
|---|---|
| Country/Territory | Canada |
| City | Ottawa, ON |
| Period | 05/16/05 → 05/19/05 |
Keywords
- Balun
- De-embedding
- Gain measurement
- On-chip antenna
ASJC Scopus subject areas
- Electrical and Electronic Engineering