Abstract
In the paper a greedy algorithm for construction of partial tests is considered. Bounds on minimal cardinality of partial reducts are obtained. Results of experiments with software implementation of the greedy algorithm are described.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Pages | 149-155 |
| Number of pages | 7 |
| Volume | 6104 |
| State | Published - 2006 |
| Externally published | Yes |
| Event | High-Power Diode Laser Technology and Applications IV - San Jose, CA, United States Duration: Jan 23 2006 → Jan 25 2006 |
Other
| Other | High-Power Diode Laser Technology and Applications IV |
|---|---|
| Country/Territory | United States |
| City | San Jose, CA |
| Period | 01/23/06 → 01/25/06 |
Keywords
- Greedy algorithm
- Partial cover
- Partial reduct
- Partial test
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics