On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite

Fabio Pareschi, Riccardo Rovatti, Gianluca Setti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

In previous papers we have addressed the problem of testing Random Number Generators (RNGs) through statistical tests, with particular emphasis on the approach we called second-level testing. We have shown that this approach is capable of achieving much higher accuracy in exposing non-random generators, but may suffer from reliability issues due to approximations introduced in the test. Here we consider the NIST Frequency Test and present a mathematical expression of the error introduced by approximating the effective discrete distribution function with its continuous limit distribution. The matching against experimental data is almost perfect. © 2008 IEEE.
Original languageEnglish (US)
Title of host publicationIEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1216-1219
Number of pages4
ISBN (Print)9781424423422
DOIs
StatePublished - Jan 1 2008
Externally publishedYes

Fingerprint

Dive into the research topics of 'On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite'. Together they form a unique fingerprint.

Cite this