TY - GEN
T1 - On the asymptotic ergodic capacity of FSO links with generalized pointing error model
AU - Al-Quwaiee, Hessa
AU - Yang, Hong-Chuan
AU - Alouini, Mohamed-Slim
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2015/9/11
Y1 - 2015/9/11
N2 - Free-space optical (FSO) communication systems are negatively affected by two physical phenomenon, namely, scintillation due to atmospheric turbulence and pointing errors. To quantize the effect of these two factors on FSO system performance, we need an effective mathematical model for them. Scintillations are typically modeled by the log-normal and Gamma-Gamma distributions for weak and strong turbulence conditions, respectively. In this paper, we propose and study a generalized pointing error model based on the Beckmann distribution. We then derive the asymptotic ergodic capacity of FSO systems under the joint impact of turbulence and generalized pointing error impairments. © 2015 IEEE.
AB - Free-space optical (FSO) communication systems are negatively affected by two physical phenomenon, namely, scintillation due to atmospheric turbulence and pointing errors. To quantize the effect of these two factors on FSO system performance, we need an effective mathematical model for them. Scintillations are typically modeled by the log-normal and Gamma-Gamma distributions for weak and strong turbulence conditions, respectively. In this paper, we propose and study a generalized pointing error model based on the Beckmann distribution. We then derive the asymptotic ergodic capacity of FSO systems under the joint impact of turbulence and generalized pointing error impairments. © 2015 IEEE.
UR - http://hdl.handle.net/10754/621326
UR - http://ieeexplore.ieee.org/document/7249128/
UR - http://www.scopus.com/inward/record.url?scp=84953790665&partnerID=8YFLogxK
U2 - 10.1109/ICC.2015.7249128
DO - 10.1109/ICC.2015.7249128
M3 - Conference contribution
SN - 9781467364324
SP - 5072
EP - 5077
BT - 2015 IEEE International Conference on Communications (ICC)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -