Keyphrases
Process Variation
100%
Carbon Nanotube Bundle
100%
Single-walled Carbon Nanotubes Bundles
100%
VLSI Interconnects
100%
Copper Interconnect
60%
Nanotubes
40%
Relative Impact
40%
Process Technology
40%
On chip
20%
Multi-walled Carbon Nanotubes (MWCNTs)
20%
Current Carrying Capacity
20%
Inductance
20%
Capacitance Model
20%
Copper Wire
20%
Sources of Variation
20%
Manufacturing Challenges
20%
3-sigma
20%
Equivalent RLC Model
20%
Engineering
Process Variation
100%
Interconnects
100%
Carbon Nanotubes
100%
Single-Walled Carbon Nanotube
60%
Nanotubes
20%
Potential Source
10%
Copper Wire
10%
Computer Science
Process Variation
100%
Relative Impact
66%