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On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials
Shaochuan Chen, Lanlan Jiang, Mark Buckwell, Xu Jing, Yanfeng Ji, Enric Grustan-Gutierrez, Fei Hui, Yuanyuan Shi, Mathias Rommel, Albena Paskaleva, Guenther Benstetter, Wing H. Ng, Adnan Mehonic, Anthony J. Kenyon, Mario Lanza
Research output: Contribution to journal › Article › peer-review
17
Scopus
citations