Optical, electrochemical, and structural properties of Er-doped porous silicon

Guido Mula; Susanna Setzu; Gianluca Manunza; Roberta Ruffilli; Andrea Falqui

doi:10.1021/jp301851h

Optical, electrochemical, and structural properties of Er-doped porous silicon

Guido Mula^*, Susanna Setzu, Gianluca Manunza, Roberta Ruffilli, Andrea Falqui

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

We present here a study of Er doping of n ⁺-type porous silicon. The samples were characterized in situ by their electrochemical behavior and ex situ by optical reflectivity and scanning electron microscopy (SEM). A clear correlation between the optical properties and the Er content of the samples is demonstrated. Refractive index dependence on Er content has also been obtained through simulations of reflectivity spectra in the 350-2500 nm range.

Original language	English (US)
Pages (from-to)	11256-11260
Number of pages	5
Journal	JOURNAL OF PHYSICAL CHEMISTRY C
Volume	116
Issue number	20
DOIs	https://doi.org/10.1021/jp301851h
State	Published - May 24 2012
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Energy
Physical and Theoretical Chemistry
Surfaces, Coatings and Films

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10.1021/jp301851h

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@article{2b8494e4543245f693080d486a3ad612,

title = "Optical, electrochemical, and structural properties of Er-doped porous silicon",

abstract = "We present here a study of Er doping of n +-type porous silicon. The samples were characterized in situ by their electrochemical behavior and ex situ by optical reflectivity and scanning electron microscopy (SEM). A clear correlation between the optical properties and the Er content of the samples is demonstrated. Refractive index dependence on Er content has also been obtained through simulations of reflectivity spectra in the 350-2500 nm range.",

author = "Guido Mula and Susanna Setzu and Gianluca Manunza and Roberta Ruffilli and Andrea Falqui",

year = "2012",

month = may,

day = "24",

doi = "10.1021/jp301851h",

language = "English (US)",

volume = "116",

pages = "11256--11260",

journal = "JOURNAL OF PHYSICAL CHEMISTRY C",

issn = "1932-7447",

publisher = "American Chemical Society",

number = "20",

}

TY - JOUR

T1 - Optical, electrochemical, and structural properties of Er-doped porous silicon

AU - Mula, Guido

AU - Setzu, Susanna

AU - Manunza, Gianluca

AU - Ruffilli, Roberta

AU - Falqui, Andrea

PY - 2012/5/24

Y1 - 2012/5/24

N2 - We present here a study of Er doping of n +-type porous silicon. The samples were characterized in situ by their electrochemical behavior and ex situ by optical reflectivity and scanning electron microscopy (SEM). A clear correlation between the optical properties and the Er content of the samples is demonstrated. Refractive index dependence on Er content has also been obtained through simulations of reflectivity spectra in the 350-2500 nm range.

AB - We present here a study of Er doping of n +-type porous silicon. The samples were characterized in situ by their electrochemical behavior and ex situ by optical reflectivity and scanning electron microscopy (SEM). A clear correlation between the optical properties and the Er content of the samples is demonstrated. Refractive index dependence on Er content has also been obtained through simulations of reflectivity spectra in the 350-2500 nm range.

UR - http://www.scopus.com/inward/record.url?scp=84861517002&partnerID=8YFLogxK

U2 - 10.1021/jp301851h

DO - 10.1021/jp301851h

M3 - Article

AN - SCOPUS:84861517002

SN - 1932-7447

VL - 116

SP - 11256

EP - 11260

JO - JOURNAL OF PHYSICAL CHEMISTRY C

JF - JOURNAL OF PHYSICAL CHEMISTRY C

IS - 20

ER -

Optical, electrochemical, and structural properties of Er-doped porous silicon

Abstract

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