TY - GEN
T1 - Parallelized Local Volatility Estimation Using GP-GPU Hardware Acceleration
AU - Douglas, Craig C.
AU - Lee, Hyoseop
AU - Sheen, Dongwoo
N1 - KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): KUS-C1-016-04
Acknowledgements: This research was supported in part by NSF grants ACI-0305466 and CNS-0720454 and Award No. KUS-C1-016-04,made by King Abdullah University of Science and Technology(KAUST) and NRF grants 2009-0080533 and NRF 2008-C00043.
This publication acknowledges KAUST support, but has no KAUST affiliated authors.
PY - 2010
Y1 - 2010
N2 - We introduce an inverse problem for the local volatility model in option pricing. We solve the problem using the Levenberg-Marquardt algorithm and use the notion of the Fréchet derivative when calculating the Jacobian matrix. We analyze the existence of the Fréchet derivative and its numerical computation. To reduce the computational time of the inverse problem, a GP-GPU environment is considered for parallel computation. Numerical results confirm the validity and efficiency of the proposed method. ©2010 IEEE.
AB - We introduce an inverse problem for the local volatility model in option pricing. We solve the problem using the Levenberg-Marquardt algorithm and use the notion of the Fréchet derivative when calculating the Jacobian matrix. We analyze the existence of the Fréchet derivative and its numerical computation. To reduce the computational time of the inverse problem, a GP-GPU environment is considered for parallel computation. Numerical results confirm the validity and efficiency of the proposed method. ©2010 IEEE.
UR - http://hdl.handle.net/10754/599137
UR - http://ieeexplore.ieee.org/document/5480362/
UR - http://www.scopus.com/inward/record.url?scp=77954451098&partnerID=8YFLogxK
U2 - 10.1109/ICISA.2010.5480362
DO - 10.1109/ICISA.2010.5480362
M3 - Conference contribution
SN - 9781424459421
BT - 2010 International Conference on Information Science and Applications
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -