TY - GEN
T1 - Performance analysis of DAST material assisted electro-optically tuned Bloch surface wave sensor
AU - Goyal, Amit
AU - Massoud, Yehia Mahmoud
N1 - KAUST Repository Item: Exported on 2023-01-05
Acknowledgements: The authors would like to acknowledge the research funding to the Innovative Technologies Laboratories (ITL) from King Abdullah University of Science and Technology (KAUST).
PY - 2022/12/20
Y1 - 2022/12/20
N2 - In this manuscript, a 4-N, N-dimethylamino-4′ -N′ -methyl-stilbazolium tosylate (DAST) material assisted electro-optically tuned Bloch Surface Wave Sensor is proposed. The structure is designed using a one-dimensional photonic crystal (1D-PhC) structure. A top defective layer of DAST as an electro-optic material is used. The analysis shows that by illuminating the device with poly-chromatic light at an incident angle of 45.11◦ results in Bloch mode excitation at a 632.8nm operating wavelength. The analytical results also demonstrate the post fabrication 47 nm BSW wavelength tuning by applying only ±5 V potential. The structure also exhibits both wavelength stability (at varying angle) and angular stability (at varying wavelength). Moreover, the structure exhibits 105.71nm/RIU sensitivity at 0V applied bias voltage having very low FWHM of
AB - In this manuscript, a 4-N, N-dimethylamino-4′ -N′ -methyl-stilbazolium tosylate (DAST) material assisted electro-optically tuned Bloch Surface Wave Sensor is proposed. The structure is designed using a one-dimensional photonic crystal (1D-PhC) structure. A top defective layer of DAST as an electro-optic material is used. The analysis shows that by illuminating the device with poly-chromatic light at an incident angle of 45.11◦ results in Bloch mode excitation at a 632.8nm operating wavelength. The analytical results also demonstrate the post fabrication 47 nm BSW wavelength tuning by applying only ±5 V potential. The structure also exhibits both wavelength stability (at varying angle) and angular stability (at varying wavelength). Moreover, the structure exhibits 105.71nm/RIU sensitivity at 0V applied bias voltage having very low FWHM of
UR - http://hdl.handle.net/10754/686771
UR - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12314/2644121/Performance-analysis-of-DAST-material-assisted-electro-optically-tuned-Bloch/10.1117/12.2644121.full
U2 - 10.1117/12.2644121
DO - 10.1117/12.2644121
M3 - Conference contribution
BT - Optoelectronic Devices and Integration XI
PB - SPIE
ER -