TY - JOUR
T1 - Performance Analysis of Dual-Hop Mixed PLC/RF Communication Systems
AU - Yang, Liang
AU - Yan, Xiaoqin
AU - Li, Sai
AU - Costa, Daniel Benevides da
AU - Alouini, Mohamed-Slim
N1 - KAUST Repository Item: Exported on 2021-06-25
Acknowledgements: This work was supported in part by the National Natural Science Foundation of China under Grant 91838302 and in part by
the Science and Technology Program of Changsha under Grant kq1907112.
PY - 2021
Y1 - 2021
N2 - In this article, we study a dual-hop mixed power line communication and radio-frequency communication (PLC/RF) system, where the connection between the PLC link and the RF link is made by a decode-and-forward or amplify-and-forward relay. It is assumed that the PLC channel is affected by both additive background noise and Poisson–Gaussian impulsive noise which suffer from log-normal fading, while the RF link undergoes generalized Rician fading. Based on this model, analytical expressions for the outage probability (OP), average bit error rate (BER), and the average channel capacity (ACC) are derived. Furthermore, asymptotic analyses for the OP and average BER as well as an upper bound expression for the ACC are presented. Illustrative numerical results are presented along with insightful discussions.
AB - In this article, we study a dual-hop mixed power line communication and radio-frequency communication (PLC/RF) system, where the connection between the PLC link and the RF link is made by a decode-and-forward or amplify-and-forward relay. It is assumed that the PLC channel is affected by both additive background noise and Poisson–Gaussian impulsive noise which suffer from log-normal fading, while the RF link undergoes generalized Rician fading. Based on this model, analytical expressions for the outage probability (OP), average bit error rate (BER), and the average channel capacity (ACC) are derived. Furthermore, asymptotic analyses for the OP and average BER as well as an upper bound expression for the ACC are presented. Illustrative numerical results are presented along with insightful discussions.
UR - http://hdl.handle.net/10754/669767
UR - https://ieeexplore.ieee.org/document/9463868/
U2 - 10.1109/JSYST.2021.3088096
DO - 10.1109/JSYST.2021.3088096
M3 - Article
SN - 2373-7816
SP - 1
EP - 12
JO - IEEE Systems Journal
JF - IEEE Systems Journal
ER -