Perovskite Thin Films via Atomic Layer Deposition

Brandon R. Sutherland; Sjoerd Hoogland; Michael M. Adachi; Pongsakorn Kanjanaboos; Chris T. O. Wong; Jeffrey J. McDowell; Jixian Xu; Oleksandr Voznyy; Zhijun Ning; Arjan J. Houtepen; Edward H. Sargent

doi:10.1002/adma.201403965

Perovskite Thin Films via Atomic Layer Deposition

Brandon R. Sutherland, Sjoerd Hoogland, Michael M. Adachi, Pongsakorn Kanjanaboos, Chris T. O. Wong, Jeffrey J. McDowell, Jixian Xu, Oleksandr Voznyy, Zhijun Ning, Arjan J. Houtepen, Edward H. Sargent

Research output: Contribution to journal › Article › peer-review

210 Scopus citations

Abstract

© 2014 Wiley-VCH Verlag GmbH & Co. KGaA. (Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI2 and subsequently CH3NH3PbI3 perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm-1.

Original language	English (US)
Pages (from-to)	53-58
Number of pages	6
Journal	Advanced Materials
Volume	27
Issue number	1
DOIs	https://doi.org/10.1002/adma.201403965
State	Published - Oct 30 2014
Externally published	Yes

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@article{32638b08167e462dacdd233b9aedcabd,

title = "Perovskite Thin Films via Atomic Layer Deposition",

abstract = "{\textcopyright} 2014 Wiley-VCH Verlag GmbH & Co. KGaA. (Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI2 and subsequently CH3NH3PbI3 perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm-1.",

author = "Sutherland, {Brandon R.} and Sjoerd Hoogland and Adachi, {Michael M.} and Pongsakorn Kanjanaboos and Wong, {Chris T. O.} and McDowell, {Jeffrey J.} and Jixian Xu and Oleksandr Voznyy and Zhijun Ning and Houtepen, {Arjan J.} and Sargent, {Edward H.}",

note = "KAUST Repository Item: Exported on 2020-10-01 Acknowledged KAUST grant number(s): KUS-11-009-21 Acknowledgements: This publication is based in part on work supported by an award (KUS-11-009-21) from the King Abdullah University of Science and Technology (KAUST), by the Ontario Research Fund Research Excellence Program and by the Natural Sciences and Engineering Research Council (NSERC) of Canada. The authors thank Cambridge Nanotech, Fritz Prinz, and Orlando Trejo for their advice on ALD PbS film fabrication. The authors thank L.T. Kunneman for his assistance in the data analysis of the transient absorption measurements. The authors also thank M. Yuan, H. Dong, R. Wolowiec, and D. Kopilovic for their help during the course of the study. This publication acknowledges KAUST support, but has no KAUST affiliated authors.",

year = "2014",

month = oct,

day = "30",

doi = "10.1002/adma.201403965",

language = "English (US)",

volume = "27",

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T1 - Perovskite Thin Films via Atomic Layer Deposition

AU - Sutherland, Brandon R.

AU - Hoogland, Sjoerd

AU - Adachi, Michael M.

AU - Kanjanaboos, Pongsakorn

AU - Wong, Chris T. O.

AU - McDowell, Jeffrey J.

AU - Xu, Jixian

AU - Voznyy, Oleksandr

AU - Ning, Zhijun

AU - Houtepen, Arjan J.

AU - Sargent, Edward H.

N1 - KAUST Repository Item: Exported on 2020-10-01 Acknowledged KAUST grant number(s): KUS-11-009-21 Acknowledgements: This publication is based in part on work supported by an award (KUS-11-009-21) from the King Abdullah University of Science and Technology (KAUST), by the Ontario Research Fund Research Excellence Program and by the Natural Sciences and Engineering Research Council (NSERC) of Canada. The authors thank Cambridge Nanotech, Fritz Prinz, and Orlando Trejo for their advice on ALD PbS film fabrication. The authors thank L.T. Kunneman for his assistance in the data analysis of the transient absorption measurements. The authors also thank M. Yuan, H. Dong, R. Wolowiec, and D. Kopilovic for their help during the course of the study. This publication acknowledges KAUST support, but has no KAUST affiliated authors.

PY - 2014/10/30

Y1 - 2014/10/30

N2 - © 2014 Wiley-VCH Verlag GmbH & Co. KGaA. (Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI2 and subsequently CH3NH3PbI3 perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm-1.

AB - © 2014 Wiley-VCH Verlag GmbH & Co. KGaA. (Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI2 and subsequently CH3NH3PbI3 perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm-1.

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DO - 10.1002/adma.201403965

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SN - 0935-9648

VL - 27

SP - 53

EP - 58

JO - Advanced Materials

JF - Advanced Materials

IS - 1

ER -

Perovskite Thin Films via Atomic Layer Deposition

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