TY - JOUR
T1 - Photoluminescence of polycrystalline CuIn 0.5 Ga 0.5 Te 2 thin films grown by flash evaporation
AU - Yandjah, L.
AU - Bechiri, L.
AU - Benabdeslem, M.
AU - Benslim, N.
AU - Amara, A.
AU - Portier, X.
AU - Bououdina, M.
AU - Ziani, Ahmed
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2018/4/3
Y1 - 2018/4/3
N2 - Polycrystalline CuIn0.5Ga0.5Te2 films were deposited by flash evaporation from ingot prepared by reacting, in stoichiometric proportions, high purity Cu, In, Ga and Te elements in vacuum sealed quartz . The as-obtained films were characterized by X – ray diffraction (XRD), transmission electron microscopy (TEM) combined with energy dispersive spectroscopy (EDS). XRD and TEM results showed that the layer has a chalcopyrite-type structure, predominantly oriented along (112) planes, with lattice parameters a = 0.61 nm and c = 1.22 nm. The optical properties in the near - infrared and visible range 600 - 2400 nm have been studied. The analysis of absorption coefficient yielded an energy gap value of 1.27 eV. Photoluminescence analysis of as-grown sample shows two main emission peaks located at 0.87 and 1.19 eV at 4 K.
AB - Polycrystalline CuIn0.5Ga0.5Te2 films were deposited by flash evaporation from ingot prepared by reacting, in stoichiometric proportions, high purity Cu, In, Ga and Te elements in vacuum sealed quartz . The as-obtained films were characterized by X – ray diffraction (XRD), transmission electron microscopy (TEM) combined with energy dispersive spectroscopy (EDS). XRD and TEM results showed that the layer has a chalcopyrite-type structure, predominantly oriented along (112) planes, with lattice parameters a = 0.61 nm and c = 1.22 nm. The optical properties in the near - infrared and visible range 600 - 2400 nm have been studied. The analysis of absorption coefficient yielded an energy gap value of 1.27 eV. Photoluminescence analysis of as-grown sample shows two main emission peaks located at 0.87 and 1.19 eV at 4 K.
UR - http://hdl.handle.net/10754/627532
UR - http://www.sciencedirect.com/science/article/pii/S0577907318300480
UR - http://www.scopus.com/inward/record.url?scp=85045662878&partnerID=8YFLogxK
U2 - 10.1016/j.cjph.2018.03.028
DO - 10.1016/j.cjph.2018.03.028
M3 - Article
SN - 0577-9073
VL - 56
SP - 904
EP - 910
JO - Chinese Journal of Physics
JF - Chinese Journal of Physics
IS - 3
ER -