Properties of a submicrometer x-ray beam at the exit of a waveguide

Werner Jark*, Silvia Di Fonzo, Stefano Lagomarsino, Alessia Cedola, Enzo Di Fabrizio, Andreas Bram, Christian Riekel

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

68 Scopus citations


This report discusses the properties of a 13-keV submicrometer x-ray beam exiting from a waveguide. Waveguides for this spectral regime can be constructed by enclosing a low-absorbing material between highly absorbant metals. Best performance is found for about 0.1 μm guiding layer thickness. Measurements of the photon beam size close to the exit and of the intensity distribution far from the exit will be presented. From these data one derives a beam size at the exit which is identical to the guiding layer thickness. This number being in the submicrometer range offers interesting perspectives for microscopy experiments in the hard x-ray range.

Original languageEnglish (US)
Pages (from-to)4831-4836
Number of pages6
JournalJournal of Applied Physics
Issue number9
StatePublished - Nov 1 1996
Externally publishedYes

ASJC Scopus subject areas

  • General Physics and Astronomy


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