Quadruple reduction of threshold current density for microring quantum dot lasers epitaxially grown on (001) Si

Yating Wan, Daehwan Jung, Justin Norman, Kaiyin Feng, Alp Dagli, Arthur C. Gossard, John E. Bowers

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A quadruple reduction of threshold current density was achieved for electrically pumped quantum-dot micro-rings epitaxially grown on (001) silicon. This was enabled by a low threading dislocation density GaAs buffer layer and a smoothed etching sidewall.
Original languageEnglish (US)
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
StatePublished - Aug 6 2018
Externally publishedYes

Fingerprint

Dive into the research topics of 'Quadruple reduction of threshold current density for microring quantum dot lasers epitaxially grown on (001) Si'. Together they form a unique fingerprint.

Cite this