Abstract
A quadruple reduction of threshold current density was achieved for electrically pumped quantum-dot micro-rings epitaxially grown on (001) silicon. This was enabled by a low threading dislocation density GaAs buffer layer and a smoothed etching sidewall.
Original language | English (US) |
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Title of host publication | 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Print) | 9781943580422 |
State | Published - Aug 6 2018 |
Externally published | Yes |