Abstract
A new method of quantitative evaluation for the toughness of interface between thick diamond films and Co-cemented tungsten carbide (WC-Co) substrates is reported. This new method derives from the previously developed technique, which was applied for the quantitative evaluation of the adhesive toughness of discrete diamond crystallites on Co-cemented tungsten carbide (WC-Co) substrates [S. Kamiya et al., Diamond Relat. Mater. 9 (2000) 191-194] and has been applied here to evaluate the adhesive toughness of various diamond films on WC-Co cutting inserts. The adhesive toughness was successfully obtained to be in the 15-23 J/m2 range and was depending on the morphology of the interface.
Original language | English (US) |
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Pages (from-to) | 716-720 |
Number of pages | 5 |
Journal | Diamond and Related Materials |
Volume | 11 |
Issue number | 3-6 |
DOIs | |
State | Published - Mar 2002 |
Externally published | Yes |
Keywords
- Adhesion strength
- Chemical vapor deposition
- Diamond coated tools
- Tungsten carbide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Chemistry
- Mechanical Engineering
- Materials Chemistry
- Electrical and Electronic Engineering