Real-time in situ growth study of TiN- and TiC xN y-based superhard nanocomposite coatings using spectroscopic ellipsometry

P. Jedrzejowski*, A. Amassian, E. Bousser, J. E. Klemberg-Sapieha, L. Martinu

*Corresponding author for this work

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11 Scopus citations

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Material Science