Realities and Challenges of III-V/Si Integration Technologies

John E. Bowers, Duanni Huang, Daehwan Jung, Justin Norman, Minh A. Tran, Yating Wan, Weiqiang Xie, Zeyu Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

The complexity of photonic integrated circuits has progressed rapidly, but serious problems remain to be solved to enable widespread application in Tbps transceivers and optical scanners. A summary of progress, problems and potential solutions is provided.
Original languageEnglish (US)
Title of host publication2019 Optical Fiber Communications Conference and Exhibition, OFC 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580538
DOIs
StatePublished - Apr 22 2019
Externally publishedYes

Fingerprint

Dive into the research topics of 'Realities and Challenges of III-V/Si Integration Technologies'. Together they form a unique fingerprint.

Cite this