Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

J. B. Roldan, D. Maldonado, F. Jimenez-Molinos, C. Acal, J. E. Ruiz-Castro, A. M. Aguilera, F. Hui, J. Kong, Y. Shi, X. Jing, C. Wen, M. A. Villena, M. Lanza

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3 Scopus citations

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