Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

J. B. Roldan, D. Maldonado, F. Jimenez-Molinos, C. Acal, J. E. Ruiz-Castro, A. M. Aguilera, F. Hui, J. Kong, Y. Shi, X. Jing, C. Wen, M. A. Villena, M. Lanza

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution