Abstract
La0.5Sr0.5CoO3 (LSCO) thin films have been deposited, using RF magnetron sputter-deposition for use as an electrode material for Pb(Zr,Ti)O3 (PZT) thin film capacitors. The effect of the O2:Ar sputter gas ratio during deposition, on the LSCO film properties was investigated. It was found that the resistivity of the LSCO films deposited at ambient temperature decreases as the O2:Ar ratio was increased for both the as-deposited and annealed films. In addition, it was found that thin overlayers of LSCO tend to stabilize the underlying Pt//Ti electrode structure during subsequent thermal processing. The LSCO//Pt//Ti composite electrode stack has a low resistivity and provides excellent fatigue performance for PZT capacitors. Furthermore, the LSCO//Pt//Ti electrode sheet resistance does not degrade with annealing temperature and the electrode does not display hillock formation. Possible mechanisms for the stabilization of the Pt//Ti electrode with LSCO overlayers will be discussed.
Original language | English (US) |
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Pages (from-to) | 145-150 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 433 |
DOIs | |
State | Published - 1996 |
Externally published | Yes |
Event | Proceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA Duration: Apr 7 1996 → Apr 12 1996 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- General Materials Science