Abstract
Atomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 395-400 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 488 |
| State | Published - 1997 |
| Externally published | Yes |
| Event | Proceedings of the 1997 MRS Fall Meeting - Boston, MA, USA Duration: Dec 2 1997 → Dec 5 1997 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- General Materials Science