Sensitivity to molecular order of the electrical conductivity in oligothiophene monolayer films

Florent Martin; Bas L.M. Hendriksen; Allard J. Katan; Yabing Qi; Clayton Mauldin; Jean M.J. Fréchet; Miquel Salmeron

doi:10.1021/la303609g

Sensitivity to molecular order of the electrical conductivity in oligothiophene monolayer films

Florent Martin, Bas L.M. Hendriksen, Allard J. Katan, Yabing Qi, Clayton Mauldin, Jean M.J. Fréchet, Miquel Salmeron^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Using conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO ₂/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.

Original language	English (US)
Pages (from-to)	1206-1210
Number of pages	5
Journal	LANGMUIR
Volume	29
Issue number	4
DOIs	https://doi.org/10.1021/la303609g
State	Published - Jan 29 2013

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

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10.1021/la303609g

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abstract = "Using conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO 2/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.",

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AU - Martin, Florent

AU - Hendriksen, Bas L.M.

AU - Katan, Allard J.

AU - Qi, Yabing

AU - Mauldin, Clayton

AU - Fréchet, Jean M.J.

AU - Salmeron, Miquel

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Y1 - 2013/1/29

N2 - Using conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO 2/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.

AB - Using conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO 2/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.

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Sensitivity to molecular order of the electrical conductivity in oligothiophene monolayer films

Abstract

ASJC Scopus subject areas

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