Engineering
Absorption Measurement
50%
Chemical Vapor Deposition
100%
Deposited Film
50%
Fourier Transform
50%
Increasing Temperature
50%
Induced Change
50%
Nitrogen Atom
50%
Oxide Film
100%
Ray Absorption
50%
Silicon Nanocrystal
100%
Silicon Oxide
100%
Vapor Deposition
100%
Physics
Chemical Bond
50%
FTIR Spectroscopy
50%
Nitrogen Atom
50%
Nucleation
100%
Oxide Film
100%
Photoluminescence
50%
Raman Spectroscopy
50%
Silicon Oxide
100%
Vapor Deposition
100%
Material Science
Amorphous Material
25%
Chemical Bonding
25%
Fourier Transform Infrared Spectroscopy
25%
Nanocrystalline Material
100%
Nucleation
50%
Oxide Film
100%
Photoluminescence
25%
Plasma-Enhanced Chemical Vapor Deposition
100%
Raman Spectroscopy
25%
Keyphrases
Embedding Matrix
33%
Nanocrystal Formation
100%
Si Content
33%
Silicon Oxide Film
100%
Silicon Rich Oxide
100%
Total Electron Yield
33%
Yield Mode
33%