Abstract
The goal of this work was to extend the FASTHENRY 3-D inductance extraction program to include the finite conductivity of a semiconductor substrate, and then use the modified program to investigate a variety of on-chip inductive effects. In addition, the limitations of a simple two-loop model for estimating coupling inductance is examined.
Original language | English (US) |
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Title of host publication | Technical Digest - International Electron Devices Meeting |
Publisher | IEEEPiscataway, NJ, United States |
Pages | 491-494 |
Number of pages | 4 |
State | Published - Dec 1 1995 |
Externally published | Yes |